ATE STT-700 Series
One platform, one software to cover all your power device test.
Two tester model:
- STT-700S – 13 slots
- STT-700 – 26 slots
Both models have same DUT boards and software, all modules are same, only difference is the multisite test capability.
Software Features:
- Support true parallel test(up to 128 sites)
- Support csv. stdf. datalog format
- Visual C++ program environment
- Support Index parallel test for discrete device final test
- Support GEM/MES industrial 4.0 automation manufacturing environment
- Table-filled simplified program for discrete test
- Real time oscilloscope capability for easy debug
Hardware Features：
Analog&Mixed Signal Device Test
- Each VI channel has AWG&Digitizer
- VI channel is floating
- 16 bit ADC/DAC in each resource
- High resolution timing measurement unit.
- High Voltage up to 1200V(optional 2500V)
- High Current up to 100A(optional 200A)
- on-board real time self-diagnostic
Discrete Device Test
- Discrete DC test modules(2000V/200A, 1400V/100A)
- UIL test module(2500v/200A)
- DVSD test module(max power > 1600W)
- Rg/Cg test module
- Dynamic Rdson Test Module(GaN)
- Dynamic test(Trr/Ton/Toff etc.,)
- Option to 3000V/4000V
Digital Device Test
- 32 digital pin per module, data rate 50Mhz/100Mhz
- 64Mhz memory depth per pin
- 64 timing sets, voltage -1.5V to +6.5V
- PMU per pin