Discrete
One platform, one software to cover all your test request.
SineTest owns the most advanced technology in discrete test , we have the patented DC test module(DDC1230E) and UIL/DVDS module etc., users can mix them to setup the most powerful wafer test or final test solution(like 8 completely separate DC test modules to realize true parall 8 sites test solution).
| Device | Type | Device name | Breakdown voltage(v) | Rdson test current(A) | Test time（ms） |
| Diode | IN4148 | 160V | 25ms | ||
| Mosfet | NPN | *6N80C | 885V | 3.8A | 39ms |
| Mosfet | NPN | **FBG30 | 1180V | 2A | 45ms |
| Mosfet | NPN | **3606PB | 60V | 60A | 47ms |
| Mosfet | NPN | **FBG30 | 1180V | 2A | 48ms（8sites） |
Our great solution in discrete wafer test and Final test:
- 16/32 sites true parallel DC wafer test
- 8 sites DC+UIL+RG wafer test
- DC+UIL+DVDS+Rg+Ciss/Coss/Crss index parallel final test soluiton
- Can compile all sites’ data into one datalog
- Smart program tool
- Due die test solution for wafet test or final test
