ATE STT-700 Series
One platform, one software to cover all your power device test
Two tester models:
- STT-700X – 13 slots
- STT-700 – 26 slots
Both models have same Loadboards and software, all modules are same, only difference is the multisite capability. STT-700 can support 416 VIs and 128 DPUs for mixed-signal device test or 4000V/400A discrete device DC+AC test.
Software Features:
- Support true parallel test(up to 128 sites) and csv/stdf datalog format
- Visual C++ program environment, support DPAT and SYL/SBL etc.,
- Support Index parallel test for discrete device final test
- Support GEM/MES industrial 4.0 automation manufacturing environment
- Table-filled simplified program for discrete device test
Hardware Features：
Analog&Mixed Signal Device Test
Discrete Device Test
Digital Device Test
Analog&Mixed Signal Device Test
- Each VI channel has AWG&Digitizer
- VI channel designed with floating ground structure
- 16 bit ADC/DAC in each resource
- High resolution timing measurement unit.
- High Voltage up to 1000V(optional 2000V)
- High Current up to 100A(optional 200A)
- Real-time accuracy self-checking on the VI board (Zero test escape,Patented)
Discrete Device Test
- Discrete DC test modules DDC2K200(2000V/200A, Patented design)
- UIL test module(3000V/200A)
- DVSD test module(max power > 1600W)
- Rg/Cg/Ciss/Coss/Crss test module
- Dynamic Rdson Test Module(GaN)
- Switching test Module(Qg/Trr/Ton/Toff etc.,)
- Option to 4000V/400A
Digital Device Test
- 32 digital pin per module, data rate 50Mhz/100Mhz
- 64Mhz memory depth per pin
- 64 timing sets, voltage -1.5V to +6.5V
- PMU per pin
Summary of analog and discrete test modules, all the modules can be used together simultanesly(in same tester).