Innovating Without Boundaries

World leading analog/mixed-signal IC and discrete device tester

SineTEST focus on the research and development of analog/Mixed-signal & discrete device test solution, with our cutting-edge technologies, SineTEST provides the best COT test solution in the industry.

  1. Real wafer level DC+Switching test solution(with universal prober) for SIC/IGBT etc.,

  2. Real-time V/I accuracy diagnostic function on VI module to provent test escape

  3. The modular design for power discrete testing enables flexible configuration of new generation complex power module(like IPM) test solution

 Main products

                STT-700X                   

STT-700

STT-300S

13 slots architecture, STT-700X can support analog/mixed-signal and discrete device.
For analog test,STT-700X can configure up to 128 digital pins and 208 analog VI channels.
For  discrete device test, STT-700X can configure different modules like DC/UIL/DVSD /RG/CG/ Switching etc., modules for multisite CP and FT test. The modular design allows flexible test configurations with a minimal footprint...

26 slots architecture, STT-700X can support analog/mixed-signal and discrete device.
For mixed-signal device test,STT-700X can configure up to 256 digital pins and 416 analog VI channels.
For  discrete device test, STT-700X can configure different modules like DC/UIL/DVSD/RG/CG/Switching etc., for multisite CP and FT test...

6 slots architecture, STT-300S is suitable for discrete device Lab use and engineering debug.
STT-700X can configure different modules like DC/UIL/DVSD/RG/CG/Switching etc., modules for single site multi-function test.
If equiped with DDC1430(1400V/30A), it can provide the fastest test time and highest UPH for small signal discrete device like diode/transistor/ mosfet etc., ...

Our patented technologies and solutions...

World no.1 real wafer level DC+switching test solution for IGBT/SIC etc., by moving switching parameter verification to the wafer stage, SineTEST empowers wafer fabs and design houses to identify switching performance issues much earlier in the development cycle...

Next generation floating ground  VI modules with real time on-board V/I accuracy diagnotic function, ensuring the VI modules operate within the user-defined accuracy range over long periods of time. This eliminates concerns about test escapes...

Modular design of discrete test like DC/Dvsd/UIL etc., user can compile any module to meet customer's complicated test request, also can mix-use IC test module with discrete test module, this feature is very important because of more and more intelligent power module need complicatd test...