Totally 1000 testers installed worldwide
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New generation VI module released to market, it has "real-time accuracy self-checking on the board" feature(patented).
This essential tool can help to achieve "zero test escape" and improve the test accuracy significantly, finally our solution will have higher UPH and save cost for you.
Patented new generation discrete DC test module (DDC2K200) released to market
This module has 2000V/200A test capability and fast test time, one module can complete single mosfet/IGBT's all DC test items, with this module you can configure dual-die or quad-die mosfet test solution easily and still can get higher UPH.
New generation digital modules (32channels/100Mbps/32M memory depth) released to market
Index-parallel Final test soluiton with one datalog for dual-die mosfet
Realized dual-die mosfet DC+UIL+DVDS+RG/CG final test soluiton with one datalog.
Developed mixed-signal device(PMU)
test solution for Active-semi
totally more than 40 systems installed in worldwide OSAT.
Launched 32 site Mosfet DC wafer test solution
Launched 4 sites Mosfet DC+UIL+RG wafer test solution
SineTest Technologies incorporated in Singapore
