Patented technology: wafer level switching test solution for SIC/IGBT released to market.
IPM(Intelligent Power Module)/PIM test solution released to market.
Totally 1000 testers installed worldwide
Patented technology:New generation VI module released to market, it has "real-time voltage and current accuracy self-checking on the board" feature.
This essential tool can help to achieve "zero test escape" and improve the test accuracy significantly for analog IC and Mixed-signal device.
Patented technology: New generation discrete DC test module (DDC2K200) released to market
2000V/200A test capability integrated into one module, which can complete single mosfet/IGBT's all DC test items. With this module you can configure dual-die or quad-die mosfet test solution easily and still can achieve higher UPH.
New generation digital modules (32channels/100Mbps/32M memory depth) released to market
Index-parallel Final test soluiton with one datalog for dual/quad/six die mosfet test
Developed mixed-signal device(PMU)
test solution（>3000 test items) for Active-semi
totally more than 50 systems installed in worldwide OSAT.
Launched 32 site Mosfet DC+UIL wafer test solution
Launched 4/8 sites Mosfet DC+UIL+RG wafer test solution
SineTest Technologies incorporated in Singapore
