ATE STT-700 Series
One platform, one software to cover all your power device test
Two tester models:
- STT-700 – 26 slots (Maximum 416 VIs and 256 digital pins)
- STT-700X – 13 slots (Maximum 208 VIs and 128 digital pins)
Both tester models have same loadboards and software, all modules are same, only difference is the multi-site capability, can test from discrete device to high pin-count analog and mixed-signal device.
Some Patented technologies:
- Support true parallel test(up to 128 sites) and csv/stdf datalog format
- Visual C++ program environment, support DPAT and SYL/SBL etc.,
- Support Index parallel test mode for analog/mixed-signal and discrete device final test
- Support GEM/MES industrial 4.0 automation manufacturing environment
Hardware and Software Features：
Analog&Mixed Signal Device Test
Discrete Device Test
Software Features
Analog&Mixed Signal Device Test
- 2/4/8/16 channels’ VI modules, each VI channel has AWG&Digitizer and designed with floating ground structure
- 16 bit ADC/DAC adopted in each VI resource
- Real-time V/I accuracy self-checking on the VI board to achieve zero test escape(Patented)
- High resolution timing measurement unit.
- High voltage up to 1000V(optional 2000V) and high current up to 100A(optional 200A)
- DPU32(32 digitall pins per module) with100Mhz vector rate and 64M memory depth per digital pin, pmu per pin, -1.5v to 6.5v,
Discrete Device Test
- Discrete DC test modules DDC2K200(2000V/200A, Patented design), option to 4000V/400A
- UIL test module(3000V/200A)
- DVSD test module(120V/50A, max power > 2400W)
- Rg/Cg/Ciss/Coss/Crss test module
- Dynamic Rdson Test Module(GaN)
- Qg test module
- Switching test module(Trr/Ton/Toff etc.,)
- Wafer level switching test solution(connected with prober) for SIC/IGBT etc.,
- multi-die mosfet module(6 in 1) ac+dc test solution
Software Features
- Support true parallel test(up to 128 sites) and csv/stdf datalog format
- Visual C++ program environment, support DPAT and SYL/SBL etc.,
- Support Index parallel test mode for analog/mixed-signal and discrete device final test
- Support GEM/MES industrial 4.0 automation manufacturing environment
Summary of analog and discrete test modules, all the modules can be used together simultanesly(in same tester).