One platform, one software to cover all your discrete device test.
SineTest owns the most advanced technology in discrete test , we have the patented technology of DC test module(DDC2K200) and UIL/DVDS module etc., users can mix them to setup the most powerful wafer test or final test solution.| Device | Type | Device name | Breakdown voltage(v) | Rdson test current(A) | Test time（ms） |
| Diode | IN4148 | 160V | 25ms | ||
| Mosfet | NPN | **3606PB | 60V | 60A | 47ms |
| Mosfet | NPN | **FBG30 | 1180V | 2A | 48ms（8sites） |
Our great solution in Mosfet/IGBT wafer test and Final test:
- Mosfet/IGBT 4/8/16/32… sites AC+DC wafer test solution
- SIC/GAN test solution(including switching test and dynamic Rdson test)
- DC+UIL+DVDS+Rg+Ciss/Coss/Crss index parallel final test soluiton
- 6 in 1 Mosfet-module final test solution
- 32 sites Mosfet DC wafer test video
- Can compile all sites’ data into one datalog with index parallel test mode
- Smart program tool
- Due/Quad die test solution for wafet test or final test
